When Zener current iz is greater than zero, gate-to-source voltage Vgs becomes voltage level Vz . In the duration fromfeedback

current is is greater than magnetizing inductor current im, and gate-to-source voltage Vgs is clamped at voltage level Vz .Re-identification of anonymized CDR datasets using social network data The voltage across the magnetizing inductor is equal to the Zener breakdown voltage Vz ; this equality causes magnetizing inductor current im to increase linearly. At t1 , feedback current is equals magnetizing inductor current im, and Zener current iz reaches zero.

When Zener current iz is less than zero  gate-to-source voltage Vgs becomes negative voltage level In the duration from t1 to t2 , Re-identification of anonymized CDR datasets using social network data feedback current is is less than the magnetizing inductor current im, and gate-to-source voltage Vgs is clamped at, feedback current is equals magnetizing inductor current im, and Zener current iz reaches zero. When Zener current iz is greater than zero, gateto- source voltage Vgs becomes voltage level Vz . Since feedback current waveform is is symmetrical, and Zener breakdown voltage Vz is assumed to be constant, the durations from each span over one half of the cycle.

According to the timing diagram illustrated feedback current is is equal to magnetizing current im at one-half of the cycle, as shown in Since feedback current  is equal to times resonant inductor current, where n is the turns ratio of the current transformer,  can be rewritten as follows: are the resonant inductor current and the magnetizing inductor current at one-half of the cycle, respectively.

According to the time-domain analysis given in prior work resonant inductor current in the half-bridge resonant inverter of and magnetizing inductor current can be expressed as respectively Referring to the derivation procedure shown in resonant inductor current of the full-bridge resonant inverter PARAMETERS OF THE SIMULATION CIRCUIT Operating frequencies of the simulated and calculated results with different gate-to-source capacitance Cgs . can be derived as follows By substituting the magnetizing inductance the parameters, as listed in Table I, the self-oscillating full-bridge electronic ballast is simulated to validate the calculated operating frequency by The gate-to-source capacitor Cgs is considered by the simulation circuit. shows the comparison of the simulated and calculated operating frequencies with the different values of the gate-to-source capacitanceCgs .With gate-to-source capacitance Cgs , the operating frequency of the simulated results decreases when gate-to-source capacitance Cgs is increased. Since the design equation of the gate-drive network does not consider gateto- source capacitance Cgs , the operating frequency of calculated

Enhanced time-based Interest protocol in content-centric networking

IN recent years, the metal halide lamp has become widely used for indoor lighting, especially in commercial areas, because of its longer lifetime, Enhanced time-based Interest protocol in content-centric networking good color rendering, and high luminous efficiency However, the metal halide lamp suffers from acoustic resonance, which causes light flickering or even arc extinction In order to avoid this acoustic-resonance Enhanced time-based Interest protocol in content-centric networking problem and to meet the electromagnetic interference limitation given by the IEC regulation, as shown in the electronic ballast is operated at radio frequency Since most of the available commercial-controlled electronic ballasts have difficulty in reaching operating frequency, self-oscillating electronic ballast is employed to drive the RF The self-oscillating half-bridge electronic ballast has been widely used in electronic ballast applications.

However, in comparison with the self-oscillating Enhanced time-based Interest protocol in content-centric networking half-bridge electronic ballast, the self-oscillating full-bridge electronic ballast, as shown , is much more suitable for the high-power applications For the development of the self-oscillating electronic ballast, the analysis and design methods have been investigated the time-domain analysis and Hamel locus were used to analyze the self-oscillating parallel resonant inverter from the standpoint of a relay system. Enhanced time-based Interest protocol in content-centric networking According to the literature the accuracy of the operating-frequency prediction via the Hamel locus approach is higher than the accuracy that can be obtained via the describing-function approach.

Enhanced time-based Interest protocol in content-centric networkings

However, the time-domain analysis is based on the assumption that ideal components are used. Enhanced time-based Interest protocol in content-centric networking When the self-oscillating electronic ballast is operated in RF, the effect caused by gate-to-source capacitor Cgs of the MOSFETs on the self-oscillating gate-drive network becomes a significant influence on the design of the operating frequency. To avoid this effect, a driver that insulates capacitor Cgs from the self-oscillating gate-drive network has been proposed However, with the additional driver, the component count and the cost of the electronic ballast are undesirably increased. Enhanced time-based Interest protocol in content-centric networking In order to avoid the acoustic-resonance problem in the metal halide lamp and to meet the EMI limitation given by IEC regulations, the electronic ballast is operated at and a self-oscillating full-bridge electronic ballast is employed to drive the RF lamp.

Enhanced time-based Interest protocol in content-centric networking Since the self-oscillating electronic ballast is operated at the effect caused by gate-to-source capacitor Cgs of the MOSFETs on the selfoscillating gate-drive network must be considered. Therefore, this paper presents the analysis of the self-oscillating gatedrive network with consideration given to the gate-to-source capacitor Cgs . ANALYSIS OF GATE CONTROL Without Consideration of Gate-to-Source Capacitor In order to simplify the analysis of the self-oscillating gatedrive networks, the following assumptions are made: steady-state operation; use of ideal active and passive components; constant dc-bus voltage; and sinusoidal resonant inductor current waveform. secondary winding LCT,s in the self-oscillating gate-drive network functions as a current source, which can be simply modeled with sinusoidal current source is in parallel with magnetizing inductor to construct an equivalent circuit, as shown in the key waveforms for the equivalent circuit of the self-oscillating gate-drive network. At initial time t0 , feedback current is is equal to magnetizing inductor current im, and Zener current iz reaches zero.

Evaluation of software-defined networking for power systems

The latter can be done by counting the number of minterms in the test function corresponding to each fault, which is a linear operation on the BDD size. Alternatively, if the test generation process used does not allow efficient retrieval of such information, a limited number of test generation Evaluation of software-defined networking for power systems queries for each fault can be made, in order to classify faults according to criteria The motivation for this classification is to sort faults depending on how “difficult” they can be detected. Thus, orderings and give priority to easy-to-detect faults, while, ordering and favor hard-to-detect faults. Clearly, orderings and give more accurate classification of faults since they are not restricted to a given test set.

 report experimental results for all five different orderings. For each ordering the relaxed test set size and the number of specified bits in the relaxed test set are reported. reports results for orderings respectively, Evaluation of software-defined networking for power systems while report this information for the initial test set. provides results for orderings, respectively at this point ignore the columns labeled as they are discussed in the next subsection The best results for all orderings, in terms of specified bits, are shown in boldfaced font. Observe that there is a clear advantage Evaluation of software-defined networking for power systems for orderingwhen considering faults with more tests easy-to-detect faults in test set , first.

Evaluation of software-defined networking for power system

In all but six circuits the most relaxed test sets are those where the faults are examined based on this rationale. Both orderings try to “accommodate” easy-to-detect faults first, in the tests considered. While ordering is most accurate than ordering the best results are obtained by the latter ordering, in most of the cases, while in the cases where is better the difference in specified bits is not large. Evaluation of software-defined networking for power systems This is attributed to the fact that the proposed method is static, it is based on an initial test set, and therefore, it suffices to classify faults only for the given test set. This observation eliminates the need for considering ordering when no accurate information on the number of tests for each fault is available, if for instance, a structural-based test generation framework is used. The same information is reported in when the orderings considered the essential faults first, those faults that have or less detections.

Considering Evaluation of software-defined networking for power systems essential faults first does not give better results. Only in one case  indicated by boldfaced font in considering essential fault first gives a better result. Nevertheless, our method allowsapplying alternative orderings with small increase on the CPU time, and keeps the best results in terms of specified bits. Impact of Relaxation on the Average Number of Detections shows experimental results justifying that random bit fixing restores the average detection parameter as well as the defect fault coverage. In this work we have considered the bridging fault model as a surrogate model to defects, using the  standard non-feedback bridging fault model The bridging fault model is considered to be the most realistic model when targeting random defects and has been used widely for the evaluation of -detect test setsAfter the circuit name and the unspecified bits, even in those tests that after the relaxationprocess detect no faults and could have been actively removed from

On Demand Multicast Routing in Wireless Sensor Networks

which can be very beneficial for a number of test-related problems. On Demand Multicast Routing in Wireless Sensor Networks Fault Ordering Effect on Relaxation The algorithm is fault-based which implies that the obtained results depend on the order in which the various faults are examined. The decision on which tests must explicitly detect each fault is taken based on the gain function which is computed using the contribution, in specified bits, of each fault in each test This contribution changes during the relaxation process, On Demand Multicast Routing in Wireless Sensor Networks since every fault detection that is removed from each test’s fault list for test changes the relations between the bits in the considered test for the faults considered. consider a test that detects three faults The contributions and  specified bits, respectively.

Assume that, when removing the first two bits become don’t care whereas when removing bit of the test becomes a don’t care. Removing results in unspecifying the last two bits of the test bits and  Also, assume that bits and become don’t cares if both faults and are removed from and bit becomes a don’t care if both faults and are removed from . On Demand Multicast Routing in Wireless Sensor Networks Let us concentrate on the contribution of fault and assume that this fault is examined second. If the algorithm examines first and the decision is to remove from , then the contribution of If the algorithm examines fault first and removesit form , then the contribution of the fault becomes When the decision on fault is to be made, the outcome may change depending on which of and has been examined first. summarizes the changes in the faults contribution for different orderings. For real circuits, the faults contribution change range can become very large, especially with -detect test sets where the average number of detections is larger and, thus, each test’s list of detected faults is larger.

On Demand Multicast Routing in Wireless Sensor Network

On Demand Multicast Routing in Wireless Sensor Networks The latter implies that the ordering of the examination of the considered faults has impact on the final ratio of specified bits in the test set. Next, we give experimental results for the proposed test relaxation method under a number of different fault orderings. Specifically, our experimentation investigates the following five different fault orderings topological order of faults examine faults closer to the primary inputs first decreasing on the number of tests detecting each fault increasing on the number of tests detecting each fault; decreasing on the number of tests detecting each fault, in the initial test set; increasing on the number of tests detecting each fault, in the initial test set. Orderings actually sort faults based on the number of tests that detect them on the initial test set. On Demand Multicast Routing in Wireless Sensor Networks This information can be easily obtained by the fault simulation procedure preceding the main algorithm application.

examines faults based on the order the corresponding circuit lines are visited during a topological traversal of the circuit’s graph. A topological order can be obtained in linear, to the size of the circuit’s graph, time. Orderings are different from and since they consider all tests that detect the corresponding fault obtained by a test generation process. Since, in our experimentation the test generation  carried out by a BDD-based framework, we are able to obtain accurate information on the total number of tests that exist for each fault efficiently. The latter can be done by counting the number of minterms in the test function corresponding to each fault, which is a linear operation on the BDD size.

IEEE Standard for Ubiquitous Green Community Control Network Protocol

This compaction effect is significant for some cases Since, to our knowledge, there is no prior work on test set relaxation for traditional -detect test IEEE Standard for Ubiquitous Green Community Control Network Protocol sets we have implemented a simple test relaxation technique in order to demonstrate the effectiveness of the proposed method. Specifically, this method is a brute-force method in which each test is fault simulated and only the detected faults that have not been covered times are used to generate IEEE Standard for Ubiquitous Green Community Control Network Protocol a new test, with fewer specified bits, to replace the one from the original test set.

Consequently, fault dropping is performed after each test replacement. In this manner, each considered test to be relaxed will IEEE Standard for Ubiquitous Green Community Control Network Protocol no longer have to target a fault if it has already been detected times. Table lists the obtained results. The initial test sets are the same as those used for the experiment in Table list the specified to total bits ratio for the brute-force and the proposed approach, respectively. In all cases the proposed methodology is more effective in decreasing the number of specified bits.

IEEE Standard for Ubiquitous Green Community Control Network Protocols

This demonstrates that the optimization goal targeted in the proposed approach helps in finding better sets of tests to target a fault such that the number of specified bits is reduced, than a straightforward approach that selects these test sets in a brute-force manner first tests in the test set that detect the fault. The comparison in carried out with a brute force technique for test set relaxation. IEEE Standard for Ubiquitous Green Community Control Network Protocol Since we acknowledge that commercial tools can also produce -detect test sets with a number of don’t cares, in the obtained results are compared to detect test sets obtained by a commercial tool. Note that, the commercial tool does not apply any relaxation process, hence, the comparison may be a inequitable. Moreover, the test sets obtained by the specific commercial tool do not have fault coverage, because of the internal test set compaction process. For these two reasons, we have slightly modified our technique in order to provide, as much as possible, a comparable comparison. Specifically, we have relaxed the restriction for detecting all times appropriately, so that the compared test sets achieve very similar -detect fault coverage.

This fault coverage is reported in of This metric can some times be misleading since it does not distinguish between a fault detected a lot of times fewer than  and one detected times . Definition 1 provides a better metric. IEEE Standard for Ubiquitous Green Community Control Network Protocol Here, we upper bound with in order to avoid counting coincidental detections. Observe that the corresponding columns in the table have very similar values. report the test set size and the percentage of don’t care bits for the test sets obtained by the commercial toolreport the test set size and the percentage of don’t care bits for the test sets obtained by the proposed method, after the modification discussed in this paragraph. Due to space limitations we show only larger circuits here which are more indicative than smaller circuits. Observe, that in all cases the percentage of don’t cares are higher for the proposed methodology even though the number of tests in the set are always smaller. In the cases of the number of test sets are significantly smaller, yet the percentage of don’t cares are still higher. These results will give much smaller actual number of specified bits in the test sets obtained

combination for fault and test which is a critical criterion for the selection of the tests that will detect each fault in the final test set. The next generation of networked experiences Both these two approaches for test generation are of linear, to the size of the circuit, complexity giving a very good alternative to the test generation process that is called a large number of times in the proposed methodology. The next generation of networked experiences Function-based frameworks can utilize various techniques for representing and manipulating the Boolean functions, such as binary decision diagrams Boolean expression diagrams BEDsBoolean satisfiability, or even combinations of these. Without any loss of generality, the proposed algorithm was implemented using a BDD-based framework expanding an in-house ATPG tool similar to that utilized in The major advantages of the utilized function-based framework the complete set of tests for a fault or group of faults is implicitly considered and obtaining a test with many unspecified bits can be done efficiently. The next generation of networked experiences Specifically, obtaining the test that has the most don’t care bits from a test function accounts in obtaining the largest cube from that function. The latter, while can be reduced to the NP-hard problem of Boolean satisfiability, is done efficiently not necessarily optimally when using BDDs. As long as the diagram representing the function can be constructed, obtaining the largest cube amounts to identifying the BDD’s shortest The next generation of networked experiences path, for the root node to the terminal node one, which is a linear, to the size of the diagram, operation. This process gives the largest cube of the corresponding function, under a certain BDD variable ordering. The reader is referred to for further details on the underlying BDD-based test generation framework. Specified Bits Reduction First we present the test set characteristics before and after applying the proposed The next generation of networked experiences method on the compact detect test sets shows the number of Primary Inputs in , next to the circuit name. reports the number of faults considered for each circuit. The number of faults considered for each circuit was obtained after applying function-basedfault equivalence rules similar to those used in on top of the reports the size of the initial, fully specified test set and gives the number of specified bits in reports the -detect fault coverage calculated using the same information for the derived relaxed test set . The next generation of networked experiences Moreover, the specified to total bits ratio after the test relaxation is reported, in The initial test sets are fully-specified, thus, , in all cases. Finally, Column shows the time required for the proposed method, in seconds. For all circuits reported the -detect fault coverage has been preserved. For the –detect fault coverage is marginally increased due to coincidental detections of faults that have less than detections in the initial test set. The latter occurs since, as we mentioned before, our method performs test generation for the list of faults remained for eachtest and, thus, extra fault detections may arise. Clearly, the proposed method helps significantly in identifying bits that can get don’t care values. The reduction in specified bits is, significant in all cases, ranging between and with an average since the average This reduction is significant, despite the fact that the detect test sets used are very compact. Typically, less compact test sets allow for higher specified bits reduction. It is also important to note that in many cases the proposed method produced smaller test sets.