Semantic interoperability in the OR.NET project on networking of medical devices and information systems A requirements analysis

For a fault we keep those detections tests that when using give the higher values, in set . Moreover, for the same fault we keep those detections that when using give the higher value, in set Theorem For some fault , the set of tests is identical to the set of tests . Proof: Set contains the tests that give the maximum values when calculating for fault . Semantic interoperability in the OR.NET project on networking of medical devices and information systems A requirements analysis By substituting we have However, the term is constant since it does not depend on and, thus The tests to be included in test set are selected by obtaining times the times Since all are non-negative integers the same test is obtained By Semantic interoperability in the OR.

NET project on networking of medical devices and information systems A requirements analysis Set contains the tests which are elements of that give the maximum value in  we have illustrating the concepts used in Theorem. Again, the term does not depend on , so we get The set of tests that give the maximum reduction in specified bits can be obtained by Since all are non-negative integers we get Equation implies that the set contains the tests from that have the minimum , the tests that are elements of the subset of of size that has the minimum sum of . The subset of of size that has the minimum sum ofis given in which, Semantic interoperability in the OR.NET project on networking of medical devices and information systems A requirements analysis however, gives the set .

Semantic interoperability in the OR.NET project on networking of medical devices and information systems A requirements analysi

Semantic interoperability in the OR.NET project on networking of medical devices and information systems A requirements analysis Hence, sets and are identical. Theorem  suggests that using for selecting the best tests to detect each fault gives exactly the same result as using Thus, there is no need to find the contribution in specified bits for all combinations of tests in the set for some fault , in order to keep those tests that give the highest reduction in terms of specified bits. presents an indicative example that illustrates the rationale of Theorem  and lists all the necessary calculations. The diagram on the left shows a test Semantic interoperability in the OR.NET project on networking of medical devices and information systems A requirements analysis set and a subset that includes all the four tests that cover fault , and . The number above each test indicates the number of specified bits that can become don’t cares if and only  is no longer detected by the test For instance, bits of can become don’t cares and this relaxation does not affect any other fault detection of , except that of .

Now, assume that and according to the problem examined we have to select that subset of with cardinality that will give me the largest gain in specified bits, defined above as . This requires the calculation of for all six pairs of tests in and select the maximum These calculations are done using and are listed on the right table For instance, if tests and are selected to detect , bits can be converted to don’t cares. Obviously, these calculations will lead to selecting the set of tests as , since this gives the largest relaxing benefit. n/d here means that the corresponding combination will reduce the -detect fault coverage of the test and it should not be considered as a possible solution.

Micro base station aided vehicular ad hoc networking

All other faults those with , are detected at least times in the relaxed test set. Increase of the fault coverage of may occur due to coincidental detections for any fault with Micro base station aided vehicular ad hoc networking. Constraint guarantees that the relaxed test set has no more tests than , preventing the relaxation process from increasing the size of the test set in an attempt to give a higher number of unspecified bit in the test set. Constraint comes directly from the definition of the relaxation problem since the overall goal is to decrease the portion of specified bits in the test set.

PROPOSED METHODOLOGY Micro base station aided vehicular ad hoc networking In the proposed method, every test in is systematically replaced by a new test with more unspecified bits. The algorithm concentrates on one fault Micro base station aided vehicular ad hoc networking at a time to determine different Micro base station aided vehicular ad hoc networking tests that detect the fault such that the number of bits that can be relaxed in the entire test set is maximized. Put differently, the algorithm determines tests to explicitly target the fault and relaxes the bits required to detect the fault in the remaining tests. We first give the theoretical framework and then we present in detail all the steps of the proposed methodology Theoretical Framework Consider a fault detected by . Let denote the set of tests in that detect fault .

Micro base station aided vehicular ad hoc networkings

The algorithm finds the tests in , given in that should detect fault Micro base station aided vehicular ad hoc networking. Consider a test . Let the number of specified bits in that can be unspecified if no longer detects be denoted by . Micro base station aided vehicular ad hoc networking In other words, Micro base station aided vehicular ad hoc networking is the contribution, in specified bits, of fault in test . Then, the total number of specified bits in that can become unspecified if fault is only detected by test and not by any other in  is given by Thus, denotes the gain in unspecified bits if fault is only explicitly targeted during the test generation by test . Of course, coincidental detection of by other tests Micro base station aided vehicular ad hoc networking may occur but this is done with no extra cost in terms of specified bits. In order to determine which tests of must explicitly target fault , we calculate different times, removing from each time this calculation is made.

All the selected tests form the set of tests that explicitly target fault . It can be argued that, since we want to find the number of test set bits that can become unspecified after keeping only detections, should take into consideration all combinations of detections. In other words, it is a question whether keeping the detections that give the larger specified bits relaxation is as effective as keeping the combination of detections that give the larger relaxation. Next, we prove that the two decision criteria are identical. First we slightly modify equations  in order to evaluate the gain and maximum gain in specified bits considering all combinations of detections for the same fault With we denote a subset of of size . Thus, is calculated for all combinations of tests out of all tests that detect fault . Similarly, becomes When an -detect test set is fault simulated against a fault list , there exist a set of faults that are detected more than times.

it becomes of great importance in  detect test sets which are intended for increased non-targeted fault and defect coverage. Coincidental fault detection  A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges by randomly fixing some test bits  occurs similarly in -detect test sets as in  detect test sets. Column of Table I gives of the fully specified  detect test set of  which is much higher than the targeted detection coverage. This shows a lot of room for relaxation in the -detect test sets. A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges At the same time, since the detections were achieved coincidentally, a relaxed test  which maintains the -detection fault coverage  will recover the reduction in when it will be finally fully specified before test application. Thus, relaxed –detect test sets are expected to maintain their non-targeted fault  and defect coverages. A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges PROBLEM FORMULATION AND NOTATION Consider a given A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges -detect test set for a combinational or a fully-scanned sequential circuit-under-test . A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges Each of the test patterns consists of strings of three-valued bits . Consider also a fault model , based on which the list of faults detected by , denoted by , is derived. For the considered fault list, the test set has – A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges detect fault coverage, denoted by and specified bits ratio, denoted by , as defined below. The -detect fault coverage of a test set , denotby is the percentage of the faults considered, under a given fault model with fault list that are detected by with at least different tests. Note, that for some faults only different tests exist can be generated by any test generation process. A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges Let denote the fault list of all faults in that are detected at least times in . Similarly, let denote the faults in that are detected less than times in . Clearly, . In the case where no tests exist for a fault , then fault is considered to be redundant. In this work, is calculated considering all faults in . Definition  For a test set , the ratio of the bits having a specified value A Tutorial on the Flexible Optical Networking Paradigm: State of the Art, Trends, and Research Challenges over the total number of test set bits is defined as the specified bits ratio, denoted by . This ratio gives a test set property that indicates how flexible a test set is. Clearly for any test set The closer the more flexible is. For fully specified test sets, The test set relaxation process refers to replacing test set with a test set such that each of the following constraints is satisfied The above constraints give the specifications of the test set relaxation problem considered. Constraint preserves the –detect fault coverage in the same way as the fault coverage is preserved in single detect test sets. If a fault is detected times in test set then fault is also detected times in the relaxed test set .

Efficient social graph augmentation schemes for a peer to peer social networking service

The dynamic method of identifies sets of faults that can be detected by a single test with a small number of specified bits and explicitly avoid multiple-times detections. In any case, the derived relaxed test sets still include some multiple- Efficient social graph augmentation schemes for a peer to peer social networking service times detections due to coincidental fault detection. In this work, we consider the concept of average fault detection in a test set, defined as follows. Definition The Average Detections of a test set expresses as denotes the average times a fault is detected by a test set .

Efficient social graph augmentation schemes for a peer to peer social networking service Hence, is the total number of detections of all faults in a considered fault list by the tests in the test set divided  by the number of faults in . Efficient social graph augmentation schemes for a peer to peer social networking service  average detections per fault in and are listed in Columns respectively. Efficient social graph augmentation schemes for a peer to peer social networking service Observe that and are much higher than in these detect test sets, due to the coincidentalfault detections. Both test sets were relaxed using a Efficient social graph augmentation schemes for a peer to peer social networking service technique similar to that ofThe average specified bits reduction fully-specified test sets allow for higher specified bit reduction than partially-specified test sets of similar size. The fault coverage and the test set size of the initial test set are maintained in . Columns  and give the and of and , respectively.

Efficient social graph augmentation schemes for a peer to peer social networking services

As expected, based on the discussion of the previous paragraph, the average detections per fault drops in the relaxed test sets, increasing the Efficient social graph augmentation schemes for a peer to peer social networking service number of unspecified bits. The motivation behind relaxing detect test sets is to make these test sets amenable to addressing additional issues beyond detection of the targeted faults. Efficient social graph augmentation schemes for a peer to peer social networking service For example, the unspecified bits can be specified appropriately to detect additional faults such as delay or bridging faults. This process is referred to as test enrichment in Alternatively, the unspecified bits can be specified in such a manner that power dissipation during test set application is minimized The recent work in proposed a new method that takes advantage of the unspecified bits produced by a standard detect ATPG tool, in order to embed multiple detection in a -detect or an -detect test set.

This method can be combined with the work proposed here, in order to maximize the times a fault is detected. In any case, fully specified test sets are finally applied. Since fully-specified test sets take advantage of coincidental fault detections to increase the average detections per fault, relaxed test sets are expected to have the same advantage when they are finally applied. Efficient social graph augmentation schemes for a peer to peer social networking service Columns  and  give the and of the test set derived after the relaxed test sets and were randomly fully specified. Observe that and . The latter holds since the average fault detections per fault is lower in the original partially specified test set , than in the final fully specified test set . Maintaining average fault detections may not be of much importance in detect test sets, since their goal is to detect the targeted faults. However,

Network virtualization based seamless networking scheme for fiber-wireless FiWi networks

the total number of unspecified bits in order to make the test set more “flexible” for other applications. Network virtualization based seamless networking scheme for fiber-wireless FiWi networks A novel systematic test replacement algorithm is proposed, in which each test is replaced by a new one that detects a subset of the faults detected by the first one, with fewer specified bits. In order to maintain the fault coverage, each fault is guaranteed to be detected at least times, where this is possible. Network virtualization based seamless networking scheme for fiber-wireless FiWi networks The algorithm explicitly removes additional more than detections for each fault.

The latter is possible since experimentation shows that in -detect test sets the average detections for each fault is much greater than , mainly, due to the presence of many easy-to-detect randomly detected faults. Network virtualization based seamless networking scheme for fiber-wireless FiWi networks Specifically, the methodology targets an optimization problem; it determines the most appropriate tests to detect a fault among all of the tests that detect the fault that give the maximum benefit in terms of specified bits savings in the entire test set. Thus, it selects the “best” tests to detect the fault Network virtualization based seamless networking scheme for fiber-wireless FiWi networks and drops the fault from the remaining tests in order to reduce the total number of specified bits in these tests. The obtained results indicate that the new method is very successful in reducing the total number of specified bits, with often a decrease to the final test set size.

Network virtualization based seamless networking scheme for fiber-wireless FiWi network

A simple X-filling Network virtualization based seamless networking scheme for fiber-wireless FiWi networks method for low power testing has been used in order to demonstrate how relaxed test sets can benefit low power testing. The rest of this paper is organized as follows elaborates on our motivation and presents supportive data. Section gives necessary notation and the problem formulation, Network virtualization based seamless networking scheme for fiber-wireless FiWi networks and Section describes the proposed technique. Acomprehensive example illustrating the proposed method’s execution is presented in Section. Section gives the obtained  experimental results for the specified bits reduction as well as the impact of the proposed method in X-filling for low power test. This experimentation was done using the popular stuck-at model; however, other linear fault models can be used such as the transition fault model. Section concludes this paper.

Network virtualization based seamless networking scheme for fiber-wireless FiWi networks MOTIVATION Previously proposed methods for deriving single-detect relaxed test sets can be categorized into static or dynamic Static methods consider an initial test set whereas dynamic methods incorporate the problem in the ATPG process. Extending these methods to -detect test sets is not straightforward. Actually, the static methods benefit from identifying essential tests a test is essential if it is the only one detecting a fault which do not exist in -detect test sets. Network virtualization based seamless networking scheme for fiber-wireless FiWi networks Moreover, the common underlying idea used in both types of methods is the identification of coincidental multiple times fault detections, a fault is detected by several different tests even though it was only targeted once in the test generation process. The latter occurs very often, especially in the traditional stuck-at fault model, because the majority of the faults are easy-to-detect also referred to as randomly detected faults. The static methods drop multiple times detection implicitly, through fault simulation and fault dropping, in order to determine bits that can be relaxed.

Such flexible test sets are also extremely crucial in low power test Data pushing using IPT in content-centric networking generation techniques like those in among many others, where important power reduction may be obtained when appropriately fixing the unspecified bits. Data pushing using IPT in content-centric networking The work in this paper considers the problem of relaxing an detect test set. The proposed method also applies to multiple detect test sets where, instead of , a variable number of tests exists per fault, but, Data pushing using IPT in content-centric networking without any loss of generality, we present it here only for -detect test sets.Whenever, necessaryweelaborate on the trivial modifications that must be made for multiple detect test sets. The method starts with an initial given test Data pushing using IPT in content-centric networking set whichcan be fully or partially specified. The total number of specified bits in the resulting test set is minimized, while maintaining its original -detect fault coverage. Furthermore, the test set size isguaranteed not to increase; actually, it is often decreased.Themotivation behind this problem is that a test bit needs to be initially  fixed only if this helps the -detect fault coverage, otherwise it can be left unspecified. The generated relaxed test set can then be used in a variety of applications that fix the unspecified bits appropriately. The applied fully specified test set is expected to have similar defect and non-targeted fault coverages to that of the original test set. This is justified Data pushing using IPT in content-centric networking by the simple observation that in existing test generation techniques considering the traditional -detect fault definition, any improvement in the coverage of non-targeted faults and defects, beyond the -detect per targeted fault improvement, is caused by the random bit fixing. The latter is supported by experimentally obtained data. Relaxation of detect test setswas studied in which proposed methods relying on various Automatic Test Pattern Generation ATPG concepts in order to identify specified bits in the test set that can be replaced by don’t care values. proposed a method for identifying don’t care bits in a test pattern using ATPG concepts such as implication and justification. used a similar rationale, taking into consideration testability measures in the justification process. Data pushing using IPT in content-centric networking Extending these methods to -detect test sets is not straightforward. Actually, all of these methods benefit from identifying essential tests which do not exist in -detect test sets. The recent method of also consider test set relaxation, but in a dynamic manner. They do not consider an initial test set to be relaxed; rather, theATPG process is restricted to consider the number of specified bits in the generated compact test set. As a result, it cannot be easily extended to -detect test sets, especially for large values of . The recent work of proposes a new static technique for test relaxation under the physically-aware -detect model, utilizing some existing concepts for detect and -detect test set relaxation. While the extension of both the static and dynamic methods to -detect test sets could be investigated, Data pushing using IPT in content-centric networking in this work we propose a new methodology that is optimized based on the characteristics and parameters of the -detect test sets. In this work, test set relaxation does not imply that the specified bits of the relaxed test set are a subset of the specified bits of the initial test set, as it is the case with the existing relaxation methods in Rather, relaxation refers to the process of increasing