memory and system architecture for networking and beyond
observation does not affect the efficiency of the proposed methodology. Example on the previous section gives more details on how the calculation and the final tests to be kept detecting are obtained. In the second iteration the algorithm considers fault which is detected by tests , , and . Computing the values for the results for tests and , respectively. memory and system architecture for networking and beyond Thus, is removed from giving that can be unspecified, and which are shown in bold in We follow the same process for faults and , while fault is kept in the only two lists that exists and without any computation. memory and system architecture for networking and beyond The iteration for fault identifies four tests that detect the fault, and .
Test is certainly one of the two “best,” yet no clear decision can be made for the second best test. Any secondary decision criterion can be used, yet in our implementation we decide in favor of the first test in the test set order. Thus, fault is removed from and giving three more unspecified bits in each test and . The latter relaxation gives a test what detects no faults memory and system architecture for networking and beyond. can be removed or not in the final test set depending on the intended application. For instance, if the application requires small application time should be removed, whereas if the targeted application demands high defect coverage should be left in the test set and all bits should be fixed appropriately.
memory and system architecture for networking and beyonds
memory and system architecture for networking and beyond All remaining faults, and are detected times and, memory and system architecture for networking and beyond thus, memory and system architecture for networking and beyond no further action is necessary. Recall that, keeping all detections for a fault that is detected or fewer times is essential, since, from the problem formulation, the -detect fault coverage should be preserved. Thus, processing these faults give no more unspecified bits and leaves the test set unchanged. In the final relaxed test set is shown, together with the list of faults detected by each test. Observe that the fault coverage since all faults are detected times, except faults and which are detected only once, as they are also detected in the initial test set . Moreover, since has only specified bits , while is a fully specified test set . Finally, the number of test patterns is the same or can be smallerdepending on the targeted application.
Thus, all three constraints of the problem considered are satisfied for this example. EXPERIMENTAL RESULTS The proposed algorithm was implemented using ANSI language, in a UNIX environment. All experiments were runon using the full-scan versions of the benchmark circuits for which initial -detect test sets exist and were provided from . In the method described in the test generation procedure is of great importance. Specifically, this procedure should be able to efficiently generate a single test pattern that detects a specific set of faults and contains a small number of specified bits. This procedure can be implemented using either a structural-based or a function-based test pattern generation/manipulation framework without affecting the effectiveness of the proposed methodology. In a structural-based framework, existing routines such as those in can be integrated in the proposed methodology outlined in can be a call to the specific routine of which returns a partially specified test pattern that detects one or more given faults. This test can be used to calculate the specified bits contribution for each fault/test